Author:
Adolfsson Dan,Siew Joanna,Marinissen Erik Jan,Larsson Erik
Cited by
5 articles.
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1. Graceful Degradation of Reconfigurable Scan Networks;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-07
2. IEEE Std. P1687.1 for Access Control of Reconfigurable Scan Networks;2020 IEEE European Test Symposium (ETS);2020-05
3. Test of Reconfigurable Modules in Scan Networks;IEEE Transactions on Computers;2018-12-01
4. Diagnosis and Layout Aware (DLA) Scan Chain Stitching;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2015-03
5. Analysis of intermittent timing fault vulnerability;Microelectronics Reliability;2012-07