Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
2 articles.
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1. Embedded Tutorial: Access to On-chip Instruments via Functional Ports;2024 IEEE 25th Latin American Test Symposium (LATS);2024-04-09
2. Robust Reconfigurable Scan Networks;2022 Design, Automation & Test in Europe Conference & Exhibition (DATE);2022-03-14