Built-In Self-Test of configurable logic blocks in Virtex-5 FPGAs

Author:

Dutton Bradley F.,Stroud Charles E.

Publisher

IEEE

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. ISFD: Efficient and Fault-tolerant In-System-Failure-Detection for LP FPGA-based Smart-Sensors in Space Expeditions;2024 20th International Conference on Distributed Computing in Smart Systems and the Internet of Things (DCOSS-IoT);2024-04-29

2. Connection Resource Testing Technology on FPGA Based on SOC core;2021 IEEE 15th International Conference on Electronic Measurement & Instruments (ICEMI);2021-10-29

3. Built-In Self-Heating Thermal Testing of FPGAs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2016-09

4. A Fault-Aware Toolchain Approach for FPGA Fault Tolerance;ACM Transactions on Design Automation of Electronic Systems;2015-03-02

5. A bitstream readback-based automatic functional test and diagnosis method for Xilinx FPGAs;Microelectronics Reliability;2014-08

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