Study of linearity indices in analog/RF circuits using EKV model and comparing the results in three different CMOS processes-Reference-Cited by-同舟云学术

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Study of linearity indices in analog/RF circuits using EKV model and comparing the results in three different CMOS processes

Published:2022-12-20 Issue: Volume: Page:
ISSN:
Container-title:2022 Iranian International Conference on Microelectronics (IICM)
language:
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Author:

Khademevatan Gholamreza¹,Jalali Ali¹

Affiliation:

1. Shahid Beheshti University,Department of Electrical Engineering,Tehran,Iran

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10151848/10152300/10152418.pdf?arnumber=10152418

Reference13 articles.

1. Minimum Power in Analog Amplifying Blocks: Presenting a Design Procedure

2. Biasing for Zero Distortion: Using the EKV\/BSIM6 Expressions

3. Charge-Based MOS Transistor Modeling

4. An Analytical MOS Transistor Model Valid in All Regions of Operation and Dedicated to Low-Voltage and Low-Current Applications

5. Design Optimization Methodology Based on Inversion Coefficient;quali;Arab J Sci Eng,2014

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