Author:
Michalak Sarah E.,DuBois Andrew J.,Storlie Curtis B.,Quinn Heather M.,Rust William N.,DuBois David H.,Modl David G.,Manuzzato Andrea,Blanchard Sean P.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
22 articles.
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1. Silent Data Corruption in Robot Operating System: A Case for End-to-End System-Level Fault Analysis Using Autonomous UAVs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023
2. Accelerated Nuclear Radiation Effects on the Raspberry Pi 3B+;2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC);2022-07
3. Reliability-Aware Runahead;2022 IEEE International Symposium on High-Performance Computer Architecture (HPCA);2022-04
4. Low-power electronic technologies for harsh radiation environments;Nature Electronics;2021-04
5. Resilience and fault tolerance in high-performance computing for numerical weather and climate prediction;The International Journal of High Performance Computing Applications;2021-02-08