Author:
Ma Chenyue,Mattausch Hans Jurgen,Matsuzawa Kazuya,Yamaguchi Seiichiro,Hoshida Teruhiko,Imade Masahiro,Koh Risho,Arakawa Takahiko,Miura-Mattausch Mitiko
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
23 articles.
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