Author:
Chen Jin,Puzyrev Yevgeniy S.,Zhang En Xia,Fleetwood Daniel M.,Schrimpf Ronald D.,Arehart Aaron R.,Ringel Steven A.,Kaun Stephen W.,Kyle Erin C. H.,Speck James S.,Saunier P.,Lee Cathy,Pantelides Sokrates T.
Funder
Defense Threat Reduction Agency
National Science Foundation
Office of Science of the U.S. Department of Energy
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
24 articles.
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