Author:
Junrui Qin ,Shuming Chen ,Bin Liang ,Zhen Ge ,Yibai He ,Yankang Du ,Biwei Liu ,Jianjun Chen ,Dawei Li
Funder
State Key Program ¿Radiation Effect in Integrated Circuits and Hardening Technology¿ of the National Natural Science Foundation of China under
Hunan Provincial Innovation Foundation for Postgraduate under
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
9 articles.
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