Funder
Österreichische Forschungsförderungsgesellschaft
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
3 articles.
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1. Investigation of Factors, Affecting the Behaviour of Id–Vg Shift in MOSFET;2024 6th International Youth Conference on Radio Electronics, Electrical and Power Engineering (REEPE);2024-02-29
2. Hot-carrier-degradation measured with charge-pumping in trench devices despite deep contacts;2023 IEEE International Integrated Reliability Workshop (IIRW);2023-10-08
3. Localizing Hot-Carrier Degradation in Silicon Trench MOSFETs;IEEE Transactions on Electron Devices;2021-04