WIP. Open-source standard cell characterization process flow on 45 nm (FreePDK45), 0.18 µm, 0.25 µm, 0.35 µm and 0.5 µm-Reference-Cited by-同舟云学术

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WIP. Open-source standard cell characterization process flow on 45 nm (FreePDK45), 0.18 µm, 0.25 µm, 0.35 µm and 0.5 µm

Published:2017-05 Issue: Volume: Page:
ISSN:
Container-title:2017 IEEE International Conference on Microelectronic Systems Education (MSE)
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Author:

Thapa Rabin,Ataei Samira,Stine James E.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7938014/7945063/07945072.pdf?arnumber=7945072

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