Modelling of Electromagnetic Immunity of Integrated Circuits by Artificial Neural Networks
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/4776128/4783361/04783468.pdf?arnumber=4783468
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Study on the Frequency-Domain Black-Box Modeling Method for the Nonlinear Behavioral Level Conduction Immunity of Integrated Circuits Based on X-Parameter Theory;Micromachines;2024-05-17
2. Conduction Immunity Modeling Approach for Nonlinear IB Module Based on Multi-Harmonic Distortion Theory in Analog-Digital Integrated Circuit (MADIC);IEICE Electronics Express;2024
3. Accelerated ageing effects on the EMC performance of LDO regulators under multi-stresses: Experimental study and prediction approach;Microelectronics Reliability;2023-08
4. Identification of Microcontroller Unit Instruction Execution Using Electromagnetic Leakage and Neural Network Classification;IEEE Transactions on Electromagnetic Compatibility;2022-08
5. EMI Susceptibility Issue in Analog Front-End for Sensor Applications;Journal of Sensors;2016
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