Defect and error tolerance in the presence of massive numbers of defects-Reference-Cited by-同舟云学术

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Defect and error tolerance in the presence of massive numbers of defects

Published:2004-05 Issue:3 Volume:21 Page:216-227
ISSN:0740-7475
Container-title:IEEE Design and Test of Computers
language:en
Short-container-title:IEEE Des. Test. Comput.

Author:

Breuer M.A.,Gupta S.K.,Mak T.M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx5/54/28929/01302088.pdf?arnumber=1302088

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4. On Development of Reliable Machine Learning Systems Based on Machine Error Tolerance of Input Images;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-04

5. An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation;Journal of Electronic Testing;2022-04

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