Author:
Hsieh Tong-Yu,Tsai Ching-Yeh,Hou Sian-Jhang,Chao Wei-Ji
Funder
National Science and Technology Council
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference46 articles.
1. Radiation-induced soft errors in advanced semiconductor technologies;Baumann;IEEE Trans. Device Mater. Reliab.,2005
2. Ares: a framework for quantifying the resilience of deep neural networks;Reagen,2018
3. St-DRC: stretchable DRAM refresh controller with no parity-overhead error correction scheme for energy-efficient DNNs;Nguyen;Des. Autom. Conf.,2019
4. A class of optimal minimum odd-weight-column SEC-DED codes;Hsiao;IBM J. Res. Dev.,1970
5. System on Chip Test Architectures: Nanometer Design for Testability;Wang,2008