Author:
Mak T.M.,Tripp M.,Meixner A.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
14 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. DDR Debug Methodology for Board Design Quality and System Robustness;2022 17th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT);2022-10-26
2. Ensuring Quality of High-Speed IO Interfaces through System Level Test;2022 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS);2022-06-06
3. A Built-in Self-Test Scheme for Memory Interfaces Timing Test and Measurement;Journal of Electronic Testing;2012-09-07
4. A Low Cost Built-In Self-Test Circuit for High-Speed Source Synchronous Memory Interfaces;2010 19th IEEE Asian Test Symposium;2010-12
5. Recent Advances in Analog, Mixed-Signal, and RF Testing;IPSJ Transactions on System LSI Design Methodology;2010