Hard-Switching Losses in Power FETs: the Role of Output Capacitance-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Hard-Switching Losses in Power FETs: the Role of Output Capacitance

Published:2021 Issue: Volume: Page:1-1
ISSN:0885-8993
Container-title:IEEE Transactions on Power Electronics
language:
Short-container-title:IEEE Trans. Power Electron.

Author:

Perera Nirmana,Jafari Armin,Soleiman Zadeh Ardebili Reza,Bollier Nicolas,Abeyratne Sunil Gamini,Matioli Elison

Funder

Bundesamt fr Energie

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/63/4359240/09627563.pdf?arnumber=9627563

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. In-Chip Microfluidic Cooling Integrated on GaN Power IC Reaching High Power Density of 78 kW/l;IEEE Transactions on Power Electronics;2024-08

2. Evaluation of GaN HEMT dv/dt Immunity and dv/dt Induced False Turn-On Energy Loss;2024 IEEE Applied Power Electronics Conference and Exposition (APEC);2024-02-25

3. Over-voltage and cross-conduction hard switching stress on schottky gate-type p-GaN HEMT in half-bridge operation. Experimental and physical approaches;Microelectronics Reliability;2023-11

4. Hard-Switching Loss Calculation Model For Fast-Switching GaN HEMT in Half-Bridge Circuit;IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society;2023-10-16

5. Switching losses in power devices: From dynamic on resistance to output capacitance hysteresis;2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe);2023-09-04

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP