A Technique for the In-Situ Experimental Extraction of the Thermal Impedance of Power Devices
Author:
Affiliation:
1. Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Naples, Italy
2. IMS Laboratory, CNRS, University of Bordeaux, Bordeaux, France
Funder
Rinaldi family
Niccolò Rinaldi
Università degli Studi di Napoli Federico II
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/63/9803836/09774003.pdf?arnumber=9774003
Reference29 articles.
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4. Transient thermal impedance of semiconductor devices
5. Transient Thermal Response Measurements of Power Transistors
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