Focuses and Concerns of Dynamic Test for Wide Bandgap Device: A Questionnaire-Based Survey-Reference-Cited by-同舟云学术

Focuses and Concerns of Dynamic Test for Wide Bandgap Device: A Questionnaire-Based Survey

Author:

Sun Peng¹^ORCID,Zou Mingrui¹^ORCID,Wang Yulei¹^ORCID,Gong Jiakun¹^ORCID,Liang Yuxi¹^ORCID,Niu Fuli¹^ORCID,Jiang Ke²^ORCID,Gao Wei³,Zeng Zheng¹^ORCID

Affiliation:

1. State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China

2. School of Integrated Circuits, Tsinghua University, Beijing, China

3. China Advanced Semiconductor Industry Innovation Alliance, Beijing, China

Funder

National Natural Science Foundation of China

Chongqing Research Program of Basic Research and Frontier Technology

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

Reference33 articles.

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