High-Bandwidth Low-Inductance Current Shunt for Wide-Bandgap Devices Dynamic Characterization-Reference-Cited by-同舟云学术

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High-Bandwidth Low-Inductance Current Shunt for Wide-Bandgap Devices Dynamic Characterization

Published:2021-04 Issue:4 Volume:36 Page:4522-4531
ISSN:0885-8993
Container-title:IEEE Transactions on Power Electronics
language:
Short-container-title:IEEE Trans. Power Electron.

Author:

Zhang Wen^ORCID,Zhang Zheyu^ORCID,Wang Fred,Brush Edward V.,Forcier Neil

Funder

Keysight Technologies through CURENT industry membership

Engineering Research Center shared facilities

National Science Foundation

U.S. Department of Energy

CURENT Industry Partnership Program

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

https://ieeexplore.ieee.org/ielam/63/9277726/9204820-aam.pdf

Cited by 34 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. A Comparative Study of Current Sensing Technologies for Switching Current Measurements;2024 International Symposium on Power Electronics, Electrical Drives, Automation and Motion (SPEEDAM);2024-06-19

4. Enhancing motor impedance measurements: broadening the spectrum from low to high frequencies;Measurement Science and Technology;2024-05-13

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