Author:
Tagro Y.,Poulain L.,Lepilliet S.,Dormieu B.,Gloria D.,Scheer P.,Dambrine G.,Danneville F.
Cited by
1 articles.
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1. RF and broadband noise investigation in High-k/Metal Gate 28-nm CMOS bulk transistor;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2014-01-06