A Compact Set of Seeds for LFSR-Based Test Generation from a Fully-Specified Compact Test Set
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2 articles.
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1. LFSR-Based Test Generation for Path Delay Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2019-02
2. Computation of Seeds for
LFSR
-Based
n
-Detection Test Generation;ACM Transactions on Design Automation of Electronic Systems;2017-03-15