Parametric Software Reliability Growth Model with Testing Effort: A Review-Reference-Cited by-同舟云学术

Parametric Software Reliability Growth Model with Testing Effort: A Review

Published:2021-12-01 Issue: Volume: Page:
ISSN:
Container-title:2021 International Conference on Computational Performance Evaluation (ComPE)
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Author:

Zubair Ahmad Md¹,Ahmad N.¹

Affiliation:

1. Tilka Manjhi Bhagalpur University,University Department of Statistics and Computer Applications,Bhagalpur,Bihar

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9751776/9751720/09752232.pdf?arnumber=9752232

Reference52 articles.

1. An Assessment of Testing-Effort Dependent Software Reliability Growth Models

2. Analysis of incorporating logistic testing-effort function into software reliability modeling

3. Analysis of Software Fault Detection and Correction Process Models with Burr Type XII Testing-Effort;imam;Proceedings of the IEEE 3rd International Conference on Computing for Sustainable Global Development (INDIACom-2016) IEEE Computer Society,2016

4. Software Reliability Growth modeling with Generalized Exponential testing– effort and optimal SOFTWARE RELEASE policy;quadri;Global Journal of Computer Science and Technology,2011

5. Software Reliability Growth Modeling with New Modified Weibull Testing–effort and Optimal Release Policy

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