Accurate S-Parameter Modeling and Material Characterization in Quasi-Optical Systems
Author:
Affiliation:
1. School of Physics and Astronomy, University of Exeter, Exeter, U.K.
2. Roger Appleby Millimetre Wave Imaging Ltd., Worcestershire, U.K.
3. European Space Research and Technology Centre, European Space Agency, Noordwijk, The Netherlands
Funder
Engineering and Physical Sciences Research Council
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Radiation
Link
http://xplorestaging.ieee.org/ielx7/5503871/9725320/09669172.pdf?arnumber=9669172
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