Improvements to Millimeter-Wave Dielectric Measurement Using Material Characterization Kit (MCK)
Author:
Affiliation:
1. National Physical Laboratory, Teddington, U.K.
2. SWISSto12 SA, Renens, Switzerland
3. School of Information and Communications Engineering, Xi’an Jiaotong University, Xi’an, China
Funder
EMPIR Project
National Measurement System Program of the U.K. Government’s Department for Science, Innovation and Technology
Participating States and from the European Union’s Horizon 2020 Research and Innovation Program
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx7/19/10367905/10316304.pdf?arnumber=10316304
Reference24 articles.
1. A New Dual-Channel Measurement Method for Accurate Characterization of Low-Permittivity and Low-Loss Materials
2. Fast and Robust Characterization of Lossy Dielectric Slabs Using Rectangular Waveguides
3. Review and Modification of Permittivity Measurement on Open Resonator for Transparent Material Measurements at Terahertz
4. Measurement of Uniaxially Anisotropic Dielectrics With a Fabry–Perot Open Resonator in the 20–50 GHz Range
5. Quantitative Analysis of Monosaccharide Concentration Using Terahertz Time-Domain Spectroscopy in Ambient Atmosphere
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1. Characterization of Dielectric Materials at WM-380 Band (500 - 750 GHz) Using Three Broadband Measurement Techniques;2024 103rd ARFTG Microwave Measurement Conference (ARFTG);2024-06-21
2. Interlaboratory Comparison of Dielectric Measurements From Microwave to Terahertz Frequencies Using VNA-Based and Optical-Based Methods;IEEE Transactions on Microwave Theory and Techniques;2024
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