Measurement of Uniaxially Anisotropic Dielectrics With a Fabry–Perot Open Resonator in the 20–50 GHz Range-Reference-Cited by-同舟云学术

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Measurement of Uniaxially Anisotropic Dielectrics With a Fabry–Perot Open Resonator in the 20–50 GHz Range

Published:2022-05 Issue:5 Volume:32 Page:441-443
ISSN:1531-1309
Container-title:IEEE Microwave and Wireless Components Letters
language:
Short-container-title:IEEE Microw. Wireless Compon. Lett.

Author:

Karpisz Tomasz¹^ORCID,Salski Bartlomiej¹^ORCID,Kopyt Pawel¹^ORCID,Krupka Jerzy²,Wojciechowski Marcin³^ORCID

Affiliation:

1. Warsaw University of Technology, Institute of Radioelectronics and Multimedia Technology, Warsaw, Poland

2. Warsaw University of Technology, Institute of Microelectronics and Optoelectronics, Warsaw, Poland

3. Central Office of Measures, Warsaw, Poland

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics

Link

http://xplorestaging.ieee.org/ielx7/7260/9771273/09737701.pdf?arnumber=9737701

Reference14 articles.

1. Complex permittivity measurements at variable temperatures of low loss dielectric substrates employing split post and single post dielectric resonators

2. Complex permittivity of some ultralow loss dielectric crystals at cryogenic temperatures

3. Microwave Characterization of Dielectric Sheets in a Plano-Concave Fabry-Perot Open Resonator

4. Numerical Determination of Two-Port Parameters from Measured Unrestricted Data

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1. Thermal characterization of a Fabry-Perot open resonator;2024 25th International Microwave and Radar Conference (MIKON);2024-07-01

2. Interlaboratory Comparison of Dielectric Measurements From Microwave to Terahertz Frequencies Using VNA-Based and Optical-Based Methods;IEEE Transactions on Microwave Theory and Techniques;2024

3. Reconstruction of Corrupted Photoplethysmography Signals Using Recursive Generative Adversarial Networks;IEEE Transactions on Instrumentation and Measurement;2024

4. Improvements to Millimeter-Wave Dielectric Measurement Using Material Characterization Kit (MCK);IEEE Transactions on Instrumentation and Measurement;2024

5. Permittivity Measurement From 40 to 70 GHz Using a DC FPOR With a Fixed Specimen Holder and an Off-Axial Feed;IEEE Transactions on Microwave Theory and Techniques;2024

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