All-Digital Circuit-Level Dynamic Variation Monitor for Silicon Debug and Adaptive Clock Control-Reference-Cited by-同舟云学术

All-Digital Circuit-Level Dynamic Variation Monitor for Silicon Debug and Adaptive Clock Control

Published:2011-09 Issue:9 Volume:58 Page:2017-2025
ISSN:1549-8328
Container-title:IEEE Transactions on Circuits and Systems I: Regular Papers
language:
Short-container-title:IEEE Trans. Circuits Syst. I

Author:

Bowman Keith A.,Tokunaga Carlos,Tschanz James W.,Raychowdhury Arijit,Khellah Muhammad M.,Geuskens Bibiche M.,Lu Shih-Lien L.,Aseron Paolo A.,Karnik Tanay,De Vivek K.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/8919/6016553/06009212.pdf?arnumber=6009212

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