Record 94 GHz performance from N-polar GaN-on-Sapphire MIS-HEMTs: 5.8 W/mm and 38.5% PAE
Author:
Affiliation:
1. University of California Santa Barbara,Santa Barbara,CA,USA
Funder
Semiconductor Research Corporation
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10019319/10019320/10019475.pdf?arnumber=10019475
Reference13 articles.
1. Bias-Dependent Electron Velocity Extracted From N-Polar GaN Deep Recess HEMTs
2. A new drain-current injection technique for the measurement of off-state breakdown voltage in FETs
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1. High-power and efficiency W-band InAlGaN/AlN/GaN high-electron-mobility transistors for future high-capacity wireless communications;Applied Physics Express;2024-08-01
2. Deep Level Effects in N-Polar AlGaN/GaN High Electron Mobility Transistors: Toward Zero Dispersion Effects;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14
3. Record D-Band Performance From Prematched N-Polar GaN-on-Sapphire Transistor With 2 W/mm and 10.6% PAE at 132 GHz;IEEE Microwave and Wireless Technology Letters;2024-04
4. High-Performance N-Polar GaN/AlGaN Metal–Insulator–Semiconductor High-Electron-Mobility Transistors with Low Surface Roughness Enabled by Chemical–Mechanical-Polishing-Incorporated Layer Transfer Technology;Crystals;2024-03-04
5. Schottky Barrier Gate N-Polar GaN-on-Sapphire Deep Recess HEMT With Record 10.5 dB Linear Gain and 50.2% PAE at 94 GHz;IEEE Microwave and Wireless Technology Letters;2024-02
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