An All-Digital True-Random-Number Generator with Integrated De-correlation and Bias Correction at 3.2-to-86 MB/S, 2.58 PJ/Bit in 65-NM CMOS
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/8484863/8502213/08502375.pdf?arnumber=8502375
Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. A 144-fJ/Bit Reliable and Compact TRNG Based on the Diffusive Resistance of 3-D Resistive Random Access Memory;IEEE Transactions on Electron Devices;2023-08
2. Design Space Exploration of TRNG Latches for Improved Entropy and Efficiency;2023 18th Conference on Ph.D Research in Microelectronics and Electronics (PRIME);2023-06-18
3. A RRAM-Based True Random Number Generator with 2T1R Architecture for Hardware Security Applications;Micromachines;2023-06-08
4. RISC-V Core for Ethical Intelligent IoT Edge: Analysis & Design Choice;2023 IEEE/ACM 23rd International Symposium on Cluster, Cloud and Internet Computing Workshops (CCGridW);2023-05
5. Provably Secure Randomness Generation from Switching Probability of Magnetic Tunnel Junctions;Physical Review Applied;2023-03-23
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