Author:
Fournier Jacques J.A.,Loubet-Moundi Philippe
Cited by
4 articles.
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1. X-Ray Fault Injection in Non-Volatile Memories on Power OFF Devices;2023 IEEE Physical Assurance and Inspection of Electronics (PAINE);2023-10-24
2. From reliability to security of devices;2021 IEEE International Electron Devices Meeting (IEDM);2021-12-11
3. Implementation of Delay-Based PUFs on Altera FPGAs;Hardware Security and Trust;2017
4. Physical Attacks and Tamper Resistance;Introduction to Hardware Security and Trust;2011-08-08