Author:
Curtis O. L.,Srour J. R.,Chiu K. Y.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
8 articles.
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1. Oxide charge accumulation in metal oxide semiconductor devices during irradiation;Journal of Applied Physics;1991-05-15
2. Radiation effects on ion-implanted silicon-dioxide films;IEEE Transactions on Nuclear Science;1989-12
3. Radiation effects on p/sup +/ poly gate MOS structures with thin oxides;IEEE Transactions on Nuclear Science;1989-12
4. Soft X-ray damage in CCD detectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1988-12
5. MOS Hardening Approaches for Low-Temperature Applications;IEEE Transactions on Nuclear Science;1977-12