Author:
Li Yuan,Donnet David,Grzegorczyk Andrzej,Cavelaars Jan,Kuper Fred
Cited by
7 articles.
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1. BCD Process Technologies;Springer Handbook of Semiconductor Devices;2022-11-11
2. Reliability Evaluations of SiCr Resistors in BCD IC Technologies;2021 IEEE International Integrated Reliability Workshop (IIRW);2021-10-04
3. Storage Reliability Estimation Method using Non-Repetitively Sampled, Accelerated Degradation Data in Quadratic Form;Transactions of the Korean Society of Mechanical Engineers - A;2019-12-31
4. Chip Reliability;Silicon Analog Components;2019-08-08
5. Chip Reliability;Silicon Analog Components;2015