Effects of scaling on muon-induced soft errors-Reference-Cited by-同舟云学术

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Effects of scaling on muon-induced soft errors

Published:2011-04 Issue: Volume: Page:
ISSN:
Container-title:2011 International Reliability Physics Symposium
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Author:

Sierawski Brian D.,Reed Robert A.,Mendenhall Marcus H.,Weller Robert A.,Schrimpf Ronald D.,Wen Shi-Jie,Wong Richard,Tam Nelson,Baumann Robert C.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5776767/5784429/05784484.pdf?arnumber=5784484

Cited by 19 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Impact of Irradiation Side on Muon-Induced Single-Event Upsets in 65-nm Bulk SRAMs;IEEE Transactions on Nuclear Science;2024-04

2. Interactions of Low-Energy Muons with Silicon: Numerical Simulation of Negative Muon Capture and Prospects for Soft Errors;Journal of Nuclear Engineering;2024-03-05

3. Utilizing Parity Checking to Optimize Soft Error Detection Through Low-Level Reexecution;IEEE Transactions on Reliability;2023-12

4. A Method of Predicting Muon-Induced SEUs Using Proton Tests and Monte Carlo Simulation;IEEE Transactions on Nuclear Science;2023-08

5. Variable Delayed Dual-Core Lockstep (VDCLS) Processor for Safety and Security Applications;Electronics;2023-01-16

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