Author:
Gao R.,Mehedi M.,Chen H.,Wang X.,Zhang J. F.,Lin X. L.,He Z. Y.,Chen Y. Q.,Lei D. Y.,Huang Y.,En Y. F.,Ji Z.,Wang R.
Cited by
2 articles.
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1. AC RTN: Testing, Modeling, and Prediction;IEEE Transactions on Electron Devices;2022-10
2. An Integral Methodology for Predicting Long-Term RTN;IEEE Transactions on Electron Devices;2022-07