Author:
Hamdioui S.,van de Goor A.J.,Rodgers M.
Cited by
59 articles.
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1. Combining Built-In Redundancy Analysis with ECC for Memory Testing;2024 IEEE European Test Symposium (ETS);2024-05-20
2. A New Test Algorithm and Fault Simulator of Simplified Three-Cell Coupling Faults for Random Access Memories;IEEE Access;2024
3. Novel March WY Approach for Dynamic Fault Detection in Memory BIST;2023 IEEE 16th International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC);2023-12-18
4. SRAM Memory Testing Methods and Analysis;Advances in Systems Analysis, Software Engineering, and High Performance Computing;2023-12-18
5. Recrudesce: IoT-Based Embedded Memories Algorithms and Self-healing Mechanism;Proceedings of Congress on Control, Robotics, and Mechatronics;2023-11-10