Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement

Author:

Cantoro Riccardo,Girard Patrick,Masante Riccardo,Sartoni Sandro,Reorda Matteo Sonza,Virazel Arnaud

Publisher

IEEE

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test;2024 IEEE European Test Symposium (ETS);2024-05-20

2. An Automated Exhaustive Fault Analysis Technique guided by Processor Formal Verification Methods;2024 25th International Symposium on Quality Electronic Design (ISQED);2024-04-03

3. Self-Test Library Generation for In-Field Test of Path Delay Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11

4. Evaluating the Impact of Aging on Path-Delay Self-Test Libraries;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03

5. Recent Trends and Perspectives on Defect-Oriented Testing;2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS);2022-09-12

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