Author:
Sayil Selahattin,Boorla Vijay K.,Yeddula Sumanth R.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
20 articles.
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1. An analytical model of crosstalk for nanometer CMOS circuits with single event transient;2022 IEEE 6th Advanced Information Technology, Electronic and Automation Control Conference (IAEAC );2022-10-03
2. Bandpass Negative Group Delay Analysis of VIu-Shaped Trace Crosstalk Effect: Invited paper;2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI);2022-08-01
3. Thermal Noise;Noise Contamination in Nanoscale VLSI Circuits;2022
4. Single Event Soft Errors;Noise Contamination in Nanoscale VLSI Circuits;2022
5. Effect of temperature and single event transient on crosstalk in coupled single‐walled carbon nanotube (SWCNT) bundle interconnects;International Journal of Circuit Theory and Applications;2021-06-26