Author:
Dai Gui,You Zhiqiang,Kuang Jishun,Huang Jiedi
Cited by
4 articles.
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1. LoCCo-Based Scan Chain Stitching for Low-Power DFT;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2017-11
2. A scan disabling-based BAST scheme for test cost and test power reduction;IEICE Electronics Express;2012
3. A scan disabling-based BAST scheme for test cost reduction;IEICE Electronics Express;2011
4. On Reducing Scan Shift Activity at RTL;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2010-07