Size Dependence of Surface-Roughness-Limited Mobility in Silicon-Nanowire FETs-Reference-Cited by-同舟云学术

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Size Dependence of Surface-Roughness-Limited Mobility in Silicon-Nanowire FETs

Published:2008-11 Issue:11 Volume:55 Page:2968-2976
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Poli Stefano,Pala Marco G.,Poiroux Thierry,Deleonibus Simon,Baccarani Giorgio

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/4668541/04668596.pdf?arnumber=4668596

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