Diagnostic data detection of faults in RAM using different march algorithms with BIST scheme
Author:
Koshy Twinkle,Arun C. S.
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Linked Coupling Faults Detection by Multirun March Tests;Applied Sciences;2024-03-15
2. A Dedicated Memory Testing Processor Design;2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI);2023-08-09