Limitations of the Intrinsic Cutoff Frequency to Correctly Quantify the Speed of Nanoscale Transistors-Reference-Cited by-同舟云学术

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Limitations of the Intrinsic Cutoff Frequency to Correctly Quantify the Speed of Nanoscale Transistors

Published:2017-06 Issue:6 Volume:64 Page:2617-2624
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Zhan Zhen^ORCID,Colomes Enrique,Oriols Xavier

Funder

European Regional Development Fund

Ministerio de Ciencia e Innovación through the Spanish Project

Generalitat de Catalunya

European Union’s Horizon 2020 Research and Innovation Programme

China Scholarship Council

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/7929292/07912365.pdf?arnumber=7912365

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Bohmian Mechanics as a Practical Tool;Fundamental Theories of Physics;2024

2. A Cut-off Frequency Measurement Platform for Subthreshold TFTs;2022 IEEE International Flexible Electronics Technology Conference (IFETC);2022-08-21

3. Identifying weak values with intrinsic dynamical properties in modal theories;Physical Review A;2021-05-28

4. A design of nanoscale double-gate FET based ring oscillator with improved oscillation frequency using device engineering;AEU - International Journal of Electronics and Communications;2021-05

5. There is Plenty of Room for THz Tunneling Electron Devices Beyond the Transit Time Limit;IEEE Electron Device Letters;2021-02

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