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S-Parameter Model of Three Parallel Interconnect Lines Generating Negative Group-Delay Effect

  • Published:2018 Issue: Volume:6 Page:57152-57159
  • ISSN:2169-3536
  • Container-title:IEEE Access
  • language:
  • Short-container-title:IEEE Access

Author:

Wan FayuORCID,Li Ningdong,Ravelo BlaiseORCID,Ji Qizheng,Ge Junxiang

Funder

National Natural Science Foundation of China

Electrostatic Research Foundation of Liu Shanghe Academicians and Experts Workstation, Beijing Orient Institute of Measurement and Test

NSF of Jiangsu

Jiangsu Innovation and Enterprise Group Talents Plan 2015

PAPD

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science

Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Design of a quint-band passive NGDC by using Taguchi’s optimization method;AEU - International Journal of Electronics and Communications;2023-11

2. Compact and Wideband Flat Negative Group Delay Circuit Investigation;IEEE Transactions on Circuits and Systems II: Express Briefs;2023-06

3. RF and Crosstalk Characterization of Chip Interconnects Using Finite Element Method;Indian Journal of Engineering and Materials Sciences;2023

4. A Compact Passive Quad‐Band Negative Group Delay Circuit With Stepped Impedance Resonator and Defected Microstrip Structure;Radio Science;2023-01

5. Design and Optimization of the Quad-Band Negative Group Delay Circuit Based on Genetic Algorithm;2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC);2022-09-01
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