Do Memories Haunt You? An Automated Black Box Testing Approach for Detecting Memory Leaks in Android Apps-Reference-Cited by-同舟云学术

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Do Memories Haunt You? An Automated Black Box Testing Approach for Detecting Memory Leaks in Android Apps

Published:2020 Issue: Volume:8 Page:12217-12231
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Amalfitano Domenico^ORCID,Riccio Vincenzo^ORCID,Tramontana Porfirio^ORCID,Fasolino Anna Rita^ORCID

Funder

Context of the Research Project OPL-APPS, IIoT Open Platform and Manufacturing Applications

Italian Ministry for University and Research

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science

Link

http://xplorestaging.ieee.org/ielx7/6287639/8948470/08959110.pdf?arnumber=8959110

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An Automated Performance Enhancement Approach for Mobile Applications;Bulletin of Business and Economics (BBE);2024-03-29

2. Transparent Runtime Change Handling for Android Apps;Proceedings of the 28th ACM International Conference on Architectural Support for Programming Languages and Operating Systems, Volume 3;2023-03-25

3. A systematic mapping study for graphical user interface testing on mobile apps;IET Software;2023-03-02

4. Automated repair of resource leaks in Android applications;Journal of Systems and Software;2022-10

5. Dynamic Testing Techniques of Non-functional Requirements in Mobile Apps: A Systematic Mapping Study;ACM Computing Surveys;2022-01-31

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