New Probe Design for Hardware Characterization by ElectroMagnetic Fault Injection
Author:
Affiliation:
1. Univ. Grenoble Alpes, CEA, Leti,Grenoble,France,F-38000
2. Equipe Commune CEA Leti- Mines Saint-Etienne CEA-Leti, Centre CMP,Gardanne,France,F-13541
3. Centre CMP Mines Saint-Etienne, CEA, Leti,Gardanne,France,F-13541
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9900492/9900921/09901104.pdf?arnumber=9901104
Reference14 articles.
1. Optical and EM Fault-Attacks on CRT-based RSA: Concrete Results;schmidt;Proceedings of the Austrochip,0
2. Local heating attacks on Flash memory devices
3. Escalating Privileges in Linux Using Voltage Fault Injection
4. A Simple Protocol to Compare EMFI platforms;toulemont;IACR Cryptol ePrint Arch,2020
5. Laser-Induced Fault Injection on Smartphone Bypassing the Secure Boot
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1. Efficient Attack-Surface Exploration for Electromagnetic Fault Injection;Constructive Side-Channel Analysis and Secure Design;2023
2. EM-Fault It Yourself: Building a Replicable EMFI Setup for Desktop and Server Hardware;2022 IEEE Physical Assurance and Inspection of Electronics (PAINE);2022-10-25
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