Efficient Attack-Surface Exploration for Electromagnetic Fault Injection

Author:

Carta Daniele Antonio EmanueleORCID,Zaccaria VittorioORCID,Quagliarella Gabriele,Molteni Maria ChiaraORCID

Publisher

Springer Nature Switzerland

Reference23 articles.

1. Bachrathy, D., Stépán, G.: Bisection method in higher dimensions and the efficiency number. Periodica polytechnica. Mech. Eng. 56, 81–86 (2012). https://doi.org/10.3311/pp.me.2012-2.01

2. Lecture Notes in Computer Science;RB Carpi,2014

3. Cui, A., Housley, R.: BADFET: defeating modern secure boot using Second-Order pulsed electromagnetic fault injection. In: 11th USENIX Workshop on Offensive Technologies (WOOT 17). USENIX Association, Vancouver, BC (2017). https://www.usenix.org/conference/woot17/workshop-program/presentation/cui

4. Dumont, M., Lisart, M., Maurine, P.: Modeling and simulating electromagnetic fault injection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(4), 680–693 (2021). https://doi.org/10.1109/TCAD.2020.3003287

5. Lecture Notes in Computer Science;L Dureuil,2016

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