Glitch It If You Can: Parameter Search Strategies for Successful Fault Injection-Reference-Cited by-同舟云学术

Glitch It If You Can: Parameter Search Strategies for Successful Fault Injection

Published:2014 Issue: Volume: Page:236-252
ISSN:0302-9743
Container-title:Smart Card Research and Advanced Applications
language:
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Author:

Carpi Rafael Boix,Picek Stjepan,Batina Lejla,Menarini Federico,Jakobovic Domagoj,Golub Marin

Publisher

Springer International Publishing

Link

http://link.springer.com/content/pdf/10.1007/978-3-319-08302-5_16

Reference12 articles.

1. Anderson, R., Kuhn, M., A, E.U.S.: Tamper resistance – a cautionary note. In: Proceedings of the Second Usenix Workshop on Electronic Commerce, pp. 1–11 (1996)

2. Kömmerling, O., Kuhn, M.G.: Design principles for tamper-resistant smartcard processors. In: Proceedings of the USENIX Workshop on Smartcard Technology on USENIX Workshop on Smartcard Technology, WOST’99, Berkeley, CA, USA, p. 2. USENIX Association (1999)

3. Lecture Notes in Computer Science;PC Kocher,1999

4. Lecture Notes in Computer Science;J-J Quisquater,2001

5. Boneh, D., DeMillo, R., Lipton, R.: New threat model breaks crypto codes. Bellcore 85 Press Release (1996)

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