Author:
Picon Thomas,Dubois Tristan,Klingler Marco,Duchamp Genevieve
Cited by
1 articles.
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1. Reliable Electromagnetic Compatibility Near-Field Probing Bench Testing of Electronic Parts : Improvement of EMC Prequalification Method When Replacing Electronic Parts;2023 Joint Asia-Pacific International Symposium on Electromagnetic Compatibility and International Conference on ElectroMagnetic Interference & Compatibility (APEMC/INCEMIC);2023-05-23