Reliable Electromagnetic Compatibility Near-Field Probing Bench Testing of Electronic Parts : Improvement of EMC Prequalification Method When Replacing Electronic Parts
Author:
Affiliation:
1. Lexmark Research and Development, Corp,Electromagnetic Compatibility Laboratory,Cebu City,Philippines
2. University of San Carlos,Department of Electrical and Electronics Engineering,Cebu City,Philippines
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10217221/10217352/10217679.pdf?arnumber=10217679
Reference17 articles.
1. Scanning mechanism of electromagnetic compatible scanner;yongxiang,2014
2. Broadband measurement of near-fields for predicting far-fields for EMC applications
3. EMC near-field electromagnetic field detection equipment;xingjia,2022
4. Near Electric Field Scanner for Two-Sided and Multilayer Printed Boards;aleksandrovich,2016
5. Applications of the Near-Field Techniques in EMC Investigations
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