Quantitative Characterization of Platinum Diselenide Electrical Conductivity With an Inverted Scanning Microwave Microscope-Reference-Cited by-同舟云学术

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Quantitative Characterization of Platinum Diselenide Electrical Conductivity With an Inverted Scanning Microwave Microscope

Published:2021-07 Issue:7 Volume:69 Page:3348-3359
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Fabi Gianluca^ORCID,Jin Xin^ORCID,Pavoni Eleonora^ORCID,Joseph C. H.,Di Donato Andrea,Mencarelli Davide,Wang Xiaopeng^ORCID,Al Hadi Richard,Morini Antonio^ORCID,Hwang James C. M.^ORCID,Farina Marco^ORCID

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx7/22/9471031/09417197.pdf?arnumber=9417197

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Inverted Scanning Microwave Microscopy of GaN/AlN High-Electron Mobility Transistors;2024 103rd ARFTG Microwave Measurement Conference (ARFTG);2024-06-21

2. Fabrication of Ultra-Sharp Tips by Dynamic Chemical Etching Process for Scanning Near-Field Microwave Microscopy;Sensors;2023-03-22

3. Analytical expressions for spreading resistance in lossy media and their application to the calibration of scanning microwave microscopy;RSC Advances;2023

4. Nanoscale Characterization of Graphene Oxide-Based Epoxy Nanocomposite Using Inverted Scanning Microwave Microscopy;Sensors;2022-12-08

5. Developments of Interfacial Measurement Using Cavity Scanning Microwave Microscopy;Scanning;2022-08-12

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