Determination of Propagation Constants and Wave Impedance of Non-Reciprocal Networks From Position-Insensitive Waveguide Measurements-Reference-Cited by-同舟云学术

Determination of Propagation Constants and Wave Impedance of Non-Reciprocal Networks From Position-Insensitive Waveguide Measurements

Published:2022-05 Issue:5 Volume:70 Page:2723-2731
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Hasar Ugur C.¹^ORCID,Kaya Yunus²^ORCID,Izginli Mucahit³^ORCID,Ozturk Hamdullah¹^ORCID,Barroso Joaquim J.⁴^ORCID,Ramahi Omar M.⁵^ORCID,Ertugrul Mehmet⁶^ORCID

Affiliation:

1. Department of Electrical and Electronics Engineering, Gaziantep University, Gaziantep, Turkey

2. Department of Electricity and Energy, Bayburt University, Bayburt, Turkey

3. Department of Electrical and Electronics Engineering, Hasan Kalyoncu University, Gaziantep, Turkey

4. Instituto Tecnológico de Aeronáutica, São José dos Campos, Brazil

5. Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, ON, Canada

6. Department of Electrical and Electronics Engineering, Ataturk University, Erzurum, Turkey

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx7/22/9769854/09737404.pdf?arnumber=9737404

Reference44 articles.

1. Propagation constant measurements of reflection-asymmetric and nonreciprocal microwave networks from S-parameters without using a reflective standard

2. Method for Retrieval of Electromagnetic Properties of Inhomogeneous Reciprocal Chiral Metamaterials

3. A Position-Independent Approach to Accurate Measurement of Broadband Electromagnetic Constitutive Parameters of Magnetodielectric Materials

4. Determination of Complex Permittivity of Low-Loss Materials From Reference-Plane Invariant Transmission/Reflection Measurements

5. Determination of Complex Permittivity of Low-Loss Samples From Position-Invariant Transmission and Shorted-Reflection Measurements

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