Thickness-Independent Reference-Plane-Invariant Noniterative Permittivity Extraction of Low-Loss Solid Dielectric Samples by Combined Use of Frequency- and Time-Domain Analyses-Reference-Cited by-同舟云学术

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Thickness-Independent Reference-Plane-Invariant Noniterative Permittivity Extraction of Low-Loss Solid Dielectric Samples by Combined Use of Frequency- and Time-Domain Analyses

Published:2024-06 Issue:6 Volume:72 Page:3496-3504
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Hasar Ugur C.¹^ORCID,Ozturk Hamdullah¹^ORCID

Affiliation:

1. Department of Electrical and Electronics Engineering, Gaziantep University, Gaziantep, Turkey

Funder

Scientific Research Unit of Gaziantep University

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/22/10550107/10508969.pdf?arnumber=10508969

Reference54 articles.

1. Microwave Electronics

2. Reconstruction of multilayered lossy dielectrics from one-sided plane wave impulse reflection responses: the bistatic case

3. Time-Domain System for Millimeter-Wave Material Characterization

4. Generalized RF Time-Domain Imaging Technique for Moving Objects on Conveyor Belts in Real Time

5. Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques

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1. Feasible Extraction Method for Permittivity Determination of Reflection-Asymmetric Structures;IEEE Transactions on Microwave Theory and Techniques;2024

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