Direct Tip-Sample Force Estimation for High-Speed Dynamic Mode Atomic Force Microscopy-Reference-Cited by-同舟云学术

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Direct Tip-Sample Force Estimation for High-Speed Dynamic Mode Atomic Force Microscopy

Published:2014-11 Issue:6 Volume:13 Page:1257-1265
ISSN:1536-125X
Container-title:IEEE Transactions on Nanotechnology
language:
Short-container-title:IEEE Trans. Nanotechnology

Author:

Karvinen Kai S.,Ruppert Michael G.,Mahata Kaushik,Moheimani S. O. R.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications

Link

http://xplorestaging.ieee.org/ielx7/7729/6949178/06913559.pdf?arnumber=6913559

Cited by 20 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Kalman Filter-Based Estimation of Surface Conductivity and Surface Variations in Scanning Tunneling Microscopy;IEEE Transactions on Control Systems Technology;2024-07

2. High-Speed Tapping Mode AFM Utilizing Recovery of Tip-Sample Interaction;IEEE Transactions on Nanotechnology;2023

3. Kalman Filter Based Estimation of Surface Conductivity in STM;2022 IEEE Conference on Control Technology and Applications (CCTA);2022-08-23

4. System identification of biological cells by atomic force microscopy;International Journal on Interactive Design and Manufacturing (IJIDeM);2022-04-03

5. Adaptive Time-Resolved Mass Spectrometry With Nanomechanical Resonant Sensors;IEEE Sensors Journal;2021-12-15

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